NTEK Group
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High frequency noise disturbance (INS) testing belongs to the EMC field; its basic test purpose is equivalent to that of international standard IEC 61000-4-4 (electrical fast transient/burst test). This test capability mainly serves customers in Japan and some Asian countries.
The test mainly simulates switching devices in circuits, such as relays: when they open or close, current in the circuit changes rapidly, and if the circuit contains inductive components the rapid current change produces transient high-voltage interference. Such interference has a wide spectrum (up to 2 GHz) and, after coupling through power lines and device-internal PCB wiring, reflection, resonance and IC amplification, may cause equipment failure. To ensure the stability of electronic products during use, immunity testing (EMS) is necessary: a high-frequency pulse generator applies several groups of pulse signals directly to the sample, and the sample's immunity is evaluated from changes in performance before, during and after the test.
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